We can deliver a solution based on our customers needs. This can range from a single measurement to a more complex solution combining consultation with simulation, development, characterization and calibration.

We offer a wide range of services:

  • Surface morphology characterization providing information on micro-roughness of almost any surface
  • Determination of material composition and structure using X-ray characterization tools
  • Sample imaging in multiple wavelength such as, X-ray and optical light
  • Multilayer coatings for EUV/X-ray applications
  • Raytracing of synchrotron beam lines etc.
  • Consultancy on EUV/X-ray test setups for beam lines etc.