We can deliver a solution based on our customers needs. This can range from a single measurement to a more complex solution combining consultation with simulation, development, characterization and calibration.
We offer a wide range of services:
Surface morphology characterization providing information on micro-roughness of almost any surface
Determination of material composition and structure using X-ray characterization tools
Sample imaging in multiple wavelength such as, X-ray and optical light
Multilayer coatings for EUV/X-ray applications
Raytracing of synchrotron beam lines etc.
Consultancy on EUV/X-ray test setups for beam lines etc.