We can deliver a solution based on our customers needs. This can range from a single measurement to a more complex solution combining consultation with simulation, development, characterization and calibration.
We offer a wide range of services:
- Surface morphology characterization providing information on micro-roughness of almost any surface
- Determination of material composition and structure using X-ray characterization tools
- Sample imaging in multiple wavelength such as, X-ray and optical light
- Multilayer coatings for EUV/X-ray applications
- Raytracing of synchrotron beam lines etc.
- Consultancy on EUV/X-ray test setups for beam lines etc.